Fuji IX80 7 X 17 100SH NIF

An extremely fine grain, high contrast ASTM Class I film suitable for detection of minute defects. It is applicable to the inspection of low atomic number materials with low kilovoltage X-ray sources as well as inspection of higher atomic number materials with high kilovoltage X-ray or gamma-ray sources. Wide exposure latitude has been demonstrated in high subject contrast applications. IX80 is generally used in direct exposure techniques or with lead screens.