An extremely fine grain, high contrast ASTM Class I film suitable for detection of minute defects. It is applicable to the inspection of low atomic number materials with low kilovoltage X-ray sources as well as inspection of higher atomic number materials with high kilovoltage X-ray or gamma-ray sources. Wide exposure latitude has been demonstrated in high subject contrast applications. IX80 is generally used in direct exposure techniques or with lead screens.
Fuji IX80 4-1/2 X 17 100SH NIF
$534.00
Fuji IX80 4-1/2 X 17 100SH NIF
Availability: 34 in stock
| Weight | 1 lbs |
|---|---|
| Manufacturer / Brand | |
| Size | 4 1/2 X 17 |
| Speed | IX80 |
| Type | NIF |
