An extremely fine grain, high contrast ASTM Class I film suitable for detection of minute defects. It is applicable to the inspection of low atomic number materials with low kilovoltage X-ray sources as well as inspection of higher atomic number materials with high kilovoltage X-ray or gamma-ray sources. Wide exposure latitude has been demonstrated in high subject contrast applications. IX80 is generally used in direct exposure techniques or with lead screens..
Fuji IX80 3-1/2 X 8-1/2 NIF 100SH
Fuji IX80 3-1/2 X 8-1/2 NIF 100SH
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